Baek, Jun-Geol: search on Z-Library

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1

SAX Breakpoints for Random Forest Based Real-Time Contrast Control Chart

Lee, In-Seok, Baek, Jun-Geol

Journal:

Proceedings of the AAAI Conference on Artificial Intelligence

Year:

2019

File:

PDF, 350 KB

2019

2

Advanced semiconductor fabrication process control using dual filter exponentially weighted moving average

Hyo-Heon Ko, Jihyun Kim, Sang-Hoon Park, Jun-Geol Baek, Sung-Shick Kim

Journal:

Journal of Intelligent Manufacturing

Year:

2012

Language:

english

File:

PDF, 617 KB

english, 2012

3

[IEEE 2013 IEEE International Congress on Big Data (BigData Congress) - Santa Clara, CA, USA (2013.06.27-2013.07.2)] 2013 IEEE International Congress on Big Data - Data Mining Approaches for Packaging Yield Prediction in the Post-fabrication Process

Park, Seung Hwan, Park, Cheong-Sool, Kim, Jun Seok, Kim, Sung-Shick, Baek, Jun-Geol, An, Daewoong

Year:

2013

Language:

english

File:

PDF, 202 KB

english, 2013

4

Bootstrap-Based T 2 Multivariate Control Charts

Phaladiganon, Poovich, Kim, Seoung Bum, Chen, Victoria C. P., Baek, Jun-Geol, Park, Sun-Kyoung

Journal:

Communications in Statistics - Simulation and Computation

Year:

2011

Language:

english

File:

PDF, 959 KB

english, 2011

5

Algorithm learning based neural network integrating feature selection and classification

Yoon, Hyunsoo, Park, Cheong-Sool, Kim, Jun Seok, Baek, Jun-Geol

Journal:

Expert Systems with Applications

Year:

2013

Language:

english

File:

PDF, 1.56 MB

english, 2013

6

[IEEE 2009 IEEE International Symposium on Assembly and Manufacturing (ISAM) - Seoul, South Korea (2009.11.17-2009.11.20)] 2009 IEEE International Symposium on Assembly and Manufacturing - A semiconductor yields prediction using stepwise support vector machine

An, Daewoong, Ko, Hyo-Heon, Gulambar, Turghun, Kim, Jihyun, Baek, Jun-Geol, Kim, Sung-Shick

Year:

2009

Language:

english

File:

PDF, 6.39 MB

english, 2009

7

Principal curve-based monitoring chart for anomaly detection of non-linear process signals

Park, Seung Hwan, Park, Cheong-Sool, Kim, Jun-Seok, Baek, Jun-Geol

Journal:

The International Journal of Advanced Manufacturing Technology

Year:

2016

Language:

english

File:

PDF, 957 KB

english, 2016

8

A Novel Image Feature for the Remaining Useful Lifetime Prediction of Bearings Based on Continuous Wavelet Transform and Convolutional Neural Network

Yoo, Youngji, Baek, Jun-Geol

Journal:

Applied Sciences

Year:

2018

Language:

english

File:

PDF, 6.84 MB

english, 2018

9

[IEEE 2019 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC) - New York, NY, USA (2019.8.1-2019.8.3)] 2019 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC) - Univiariate Signal Preprocessing Methodology for Fault Detection in Semiconductor Manufacturing Process

Chang, Kyuchang, Baek, Jun-Geol

Year:

2019

File:

PDF, 318 KB

2019

10

Analysis of the time dependency of ammonia-oxidizing bacterial community dynamics in an activated sludge bioreactor

Jun-Geol Baek, Jonghyuck Park, Taek-Seung Kim, Hee-Deung Park

Journal:

Journal of Bioscience and Bioengineering

Year:

2011

Language:

english

File:

PDF, 338 KB

english, 2011

11

[IEEE 2013 IEEE International Congress on Big Data (BigData Congress) - Santa Clara, CA, USA (2013.06.27-2013.07.2)] 2013 IEEE International Congress on Big Data - Point and Interval Estimation Method for Auto-regressive Model with Nonnormal Error

Lim, Bo Mi, Kim, Jongwoo, Kim, Sung-Shick, Baek, Jun-Geol

Year:

2013

Language:

english

File:

PDF, 407 KB

english, 2013

12

Asynchronous action-reward learning for nonstationary serial supply chain inventory control

Chang Ouk Kim, Ick-Hyun Kwon, Jun-Geol Baek

Journal:

Applied Intelligence

Year:

2009

Language:

english

File:

PDF, 91 KB

english, 2009

13

Fault detection of cycle-based signals using wavelet transform in FAB processes

Jun Seok Kim, Jae Hyun Lee, Ji-Hyun Kim, Jun-Geol Baek, Sung-Shick Kim

Journal:

International Journal of Precision Engineering and Manufacturing

Year:

2010

Language:

english

File:

PDF, 2.23 MB

english, 2010

14

A Clustering-Based Equipment Condition Model of Chemical Vapor Deposition Process

Yoo, Youngji, Park, Seung Hwan, Baek, Jun-Geol

Journal:

International Journal of Precision Engineering and Manufacturing

Year:

2019

Language:

english

File:

PDF, 1.59 MB

english, 2019

15

Real-time contrasts control chart using random forests with weighted voting

Jang, Seongwon, Park, Seung Hwan, Baek, Jun-Geol

Journal:

Expert Systems with Applications

Year:

2017

Language:

english

File:

PDF, 1.69 MB

english, 2017

16

Intelligent adaptive process control using dynamic deadband for semiconductor manufacturing

Hyo-Heon Ko, Jun-Seok Kim, Jihyun Kim, Jun-Geol Baek, Sung-Shick Kim

Journal:

Expert Systems with Applications

Year:

2011

Language:

english

File:

PDF, 1.12 MB

english, 2011

17

Asynchronous action-reward learning for nonstationary serial supply chain inventory control

Chang Ouk Kim, Ick-Hyun Kwon, Jun-Geol Baek

Journal:

Applied Intelligence

Year:

2008

Language:

english

File:

PDF, 487 KB

english, 2008

18

Oversampling method using outlier detectable generative adversarial network

Oh, Joo-Hyuk, Hong, Jae Yeol, Baek, Jun-Geol

Journal:

Expert Systems with Applications

Year:

2019

File:

PDF, 7.64 MB

2019

19

[IEEE 2019 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC) - New York, NY, USA (2019.8.1-2019.8.3)] 2019 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC) - Segmented Dynamic Time Warping Based Signal Pattern Classification

Hong, Jae Yeol, Park, Seung Hwan, Baek, Jun-Geol

Year:

2019

Language:

english

File:

PDF, 115 KB

english, 2019

20

Kernel-Density-Based Particle Defect Management for Semiconductor Manufacturing Facilities

Park, Seung, Kim, Sehoon, Baek, Jun-Geol

Journal:

Applied Sciences

Year:

2018

Language:

english

File:

PDF, 5.36 MB

english, 2018

21

A two-phase heuristic algorithm for cell formation problems considering alternative part routes and machine sequences

Ouk Kim *, Chang, Baek, Jun-Geol, Baek, Jong-Kwan

Journal:

International Journal of Production Research

Year:

2004

Language:

english

File:

PDF, 191 KB

english, 2004

22

[IEEE 2009 IEEE International Symposium on Assembly and Manufacturing (ISAM) - Seoul, South Korea (2009.11.17-2009.11.20)] 2009 IEEE International Symposium on Assembly and Manufacturing - A solution for glasses assembly problem in cell processes of LCD via optimization-based approach

Park, Jonghyuck, Kim, Jihyun, Baek, Jun-Geol, Kim, Sung-Shick

Year:

2009

Language:

english

File:

PDF, 6.39 MB

english, 2009

23

Oversampling method using outlier detectable generative adversarial network

Oh, Joo-Hyuk, Hong, Jae Yeol, Baek, Jun-Geol

Journal:

Expert Systems with Applications

Year:

2019

Language:

english

File:

PDF, 7.64 MB

english, 2019

24

An integrated music video browsing system for personalized television

Hyoung-Gook Kim, Jin Young Kim, Jun-Geol Baek

Journal:

Expert Systems with Applications

Year:

2011

Language:

english

File:

PDF, 1.82 MB

english, 2011

25

Online learning of the cause-and-effect knowledge of a manufacturing process

Baek, Jun-Geol, Kim, Chang-Ouk, Kim, Sung Shick

Journal:

International Journal of Production Research

Year:

2002

Language:

english

File:

PDF, 403 KB

english, 2002

26

Spline regression based feature extraction for semiconductor process fault detection using support vector machine

Jonghyuck Park, Ick-Hyun Kwon, Sung-Shick Kim, Jun-Geol Baek

Journal:

Expert Systems with Applications

Year:

2011

Language:

english

File:

PDF, 655 KB

english, 2011

27

[IEEE 2019 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC) - New York, NY, USA (2019.8.1-2019.8.3)] 2019 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC) - Generative Pseudorehearsal Strategy for Fault Classification Under an Incremental Learning

Lee, Subin, Baek, Jun-Geol

Year:

2019

File:

PDF, 15.55 MB

2019

28

Learning single-issue negotiation strategies using hierarchical clustering method

Jun-Geol Baek, Chang Ouk Kim

Journal:

Expert Systems with Applications

Year:

2007

Language:

english

File:

PDF, 224 KB

english, 2007

29

A machine cell formation algorithm for simultaneously minimising machine workload imbalances and inter-cell part movements

Chang Ouk Kim, Jun-Geol Baek, Jin Jun

Journal:

The International Journal of Advanced Manufacturing Technology

Year:

2005

Language:

english

File:

PDF, 316 KB

english, 2005

30

A simulation based heuristic for serial inventory systems under fill-rate constraints

Ick-Hyun Kwon, Sung-Shick Kim, Jun-Geol Baek

Journal:

The International Journal of Advanced Manufacturing Technology

Year:

2006

Language:

english

File:

PDF, 163 KB

english, 2006

31

[IEEE 2017 IEEE 11th International Conference on Semantic Computing (ICSC) - San Diego, CA, USA (2017.1.30-2017.2.1)] 2017 IEEE 11th International Conference on Semantic Computing (ICSC) - Solving the Singularity Problem of Semiconductor Process Signal Using Improved Dynamic Time Warping

Hong, Jae Yeol, Park, Seung Hwan, Baek, Jun-Geol

Year:

2017

Language:

english

File:

PDF, 369 KB

english, 2017

32

Feature-Learning-Based Printed Circuit Board Inspection via Speeded-Up Robust Features and Random Forest

Yuk, Eun, Park, Seung, Park, Cheong-Sool, Baek, Jun-Geol

Journal:

Applied Sciences

Year:

2018

Language:

english

File:

PDF, 4.15 MB

english, 2018

33

A batch scheduling scheme for the workcenter that supplies parts to a mixed-model assembly line

Jun-Geol Baek, Jong-Kwan Baek, Sung-Shick Kim

Journal:

Computers & Industrial Engineering

Year:

1997

Language:

english

File:

PDF, 305 KB

english, 1997

34

[IEEE 2017 IEEE 11th International Conference on Semantic Computing (ICSC) - San Diego, CA, USA (2017.1.30-2017.2.1)] 2017 IEEE 11th International Conference on Semantic Computing (ICSC) - Various Type of Wavelet Filters on Time Series Forecasting

Park, Keun-Tae, Baek, Jun-Geol

Year:

2017

Language:

english

File:

PDF, 398 KB

english, 2017

35

Density weighted support vector data description

Cha, Myungraee, Kim, Jun Seok, Baek, Jun-Geol

Journal:

Expert Systems with Applications

Year:

2014

Language:

english

File:

PDF, 816 KB

english, 2014

36

[IEEE 2009 IEEE International Symposium on Assembly and Manufacturing (ISAM) - Seoul, South Korea (2009.11.17-2009.11.20)] 2009 IEEE International Symposium on Assembly and Manufacturing - Dynamic deadband control in semiconductor manufacturing

Ko, Hyo-Heon, Kim, Jihyun, Baek, Jun-Geol, Kim, Sung-Shick

Year:

2009

Language:

english

File:

PDF, 3.94 MB

english, 2009

37

SSDTW: shape segment dynamic time warping

Hong, Jae Yeol, Park, Seung Hwan, Baek, Jun-Geol

Journal:

Expert Systems with Applications

Year:

2020

File:

PDF, 8.02 MB

2020

38

Dispatching rule for non-identical parallel machines with sequence-dependent setups and quality restrictions

Hyo-Heon Ko, Jihyun Kim, Sung-Shick Kim, Jun-Geol Baek

Journal:

Computers & Industrial Engineering

Year:

2010

Language:

english

File:

PDF, 837 KB

english, 2010

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